IC10單晶高溫合金葉片熒光滲透檢測(cè)的缺陷顯示

IC10單晶高溫合金葉片熒光滲透檢測(cè)的缺陷顯示The Defect Indication of Fluorescent Penetrating Inspection for IC10 Single Crystal Super Alloy Blade

對(duì)IC10單晶高溫合金導(dǎo)向葉片熒光滲透檢測(cè)的缺陷熒光顯示進(jìn)行了分析，確定了缺陷性質(zhì)主要為顯微疏松缺陷；通過(guò)對(duì)比試驗(yàn)獲取了航空發(fā)動(dòng)機(jī)渦輪葉片常用的滲透檢測(cè)靈敏度等級(jí)和方法的特點(diǎn)和區(qū)別。試驗(yàn)結(jié)果表明：采用后乳化熒光滲透檢測(cè)法對(duì)IC10單晶高溫合金導(dǎo)向葉片缺陷的檢出更為合適。

The defects indications are analysed for IC10 single crystal blades inspected by FPI method. The defects indications are mainly microporosity defects, the FPI sensitivity class and the character and difference of method are got by FPI contrast testing. It is indicated that the Post emulsification fluorescence penetrant inspecting method is fit for defect inspection.

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